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| Recent News
VARIOSCALE VarioScale have just introduced a new tool - the VarioProfiler. An extension of the technology introduced in the VarioMetric; the VarioProfiler provides both thickness and flatness mapping with automated measurements of multiple material layers.For information about the VarioProfiler please contact us at info@leftcoastinstruments.com. IRIS (IONIZING RADIATION IMAGING SYSTEMS) We are pleased to announce that we now authorized distributors for this innovative product worldwide, with the exception of the United States of America. You can now transform your existing optical microscope into an x-ray microscope with x-ray imaging resolutions down to 3µm. The XRS2D50 is compatible with any industry-standard inverted microscope. It is ideal for a wide range of life science and high-technology applications, including: small animal studies; SEM smaple preparation; nanotechnology; materials sciences; forensics; failure analysis; PCBs; ICs; Pharmateutical research.For information about the IRIS X-Ray Imaging System please contact us at info@leftcoastinstruments.com. LEICA We are pleased to announce that we now authorized representatives for Leica Ion Mills. The RES 101 and TIC 020 Triple Beam Ion Mills are now available in Northern California exclusively from Left Coast Instruments, Inc.For information about these Leica Ion Mills and their applications please contact us at info@leftcoastinstruments.com.
VARIOSCALE We are pleased to announce that we now represent Varioscale in the Americas. Varioscale is the World Leader in scalable laser micromachining and novel metrology solutions. Varioscale's in-depth knowledge and wide experience of laser chemistry, the materials sciences, photonics and high precision automation provide an unmatched capability. Their focus is a well-balanced mixture of innovation, problem solving, and a thorough understanding of material processing requirements in the semiconductor and biomedical industries.Varioscales commitment to their customer base is unparalleled; providing fast turn-around service and support worldwide.
VARIOEDIT- a Laser Assisted Chemical Etching (LACE) tool pioneered for Backside Circuit Edit, Laser Chemical Vapor Deposition (LCVD) and Laser Assisted Dielectric Deposition VARIOMETRIC- The VarioMetric measurement system is a novel optical based solution for non-contact metrology of thick and thin materials. The patent pending VarioMetric method integrates advancements in near-infrared technology and broadband reflectometry for repeatable thickness measurements of materials, irrespective of their composition or texture. For information about these Varioscale Products and their applications please contact us at info@leftcoastinstruments.com. XRT see XRT: PCX Phase Contrast Imaging Systems Phase Contrast X-Ray Imaging. X-Ray Phase contrast plays an important part in enabling contrast for both 2D Radiography and 3D Micro-Tomography X-Ray Images. The PCX Systems are specifically designed to capture and retrieve both Phase and Absorption Contrast Imaging.PCX Imaging Systems from XRT, Ltd. are the only commercially available X-Ray Imaging Systems that offer Phase Contrast Enhancement Alogrithims. Phase Contrast image enhancement provides significant advantages for a wide variety of sample types. Application Areas Include: Materials Sciences: Plastics, Composites, Metal/Polymer Foams, NanoStructures, Cements, Ceramics, Alloys, Paper Life Sciences: Bio-Medical Engineering, Bone Architecture, Surgical Implants, Pharmaceuticals, Botany, Zoology Micro-Electronics: Semiconductor Devices, MEMS, IC Packaging, Encapsulant Delamination Problesm Earth Sciences: Gemstones, Geo-Polymers, Porosity in Sandstones etc. Food Technology: Dairy Foams, Food Texture, Packaging The PCX Systems from XRT are now available in three configurations. In addition to the standardPCX-100 we now offer a Large Sample Stage System (PCX-340) and a BareFrame System (PCX-100BF) with a minimum spot size of 1 µm achieving spatial resolutions down to 0.5 µm. For additional information about these PCX models and their applications please contact us at info@leftcoastinstruments.com. RELTRON see Reltron:Fast EL Mapper (ICS-1000 EL Solar Cell Inspector) Reltrons Fast EL Mapper (Patents Pending) offers the Photovoltaic Industry a comprehensive Real-Time investigative toolset for R&D that includes the following measurement parameters - Minority Carrier Lifetime Measurements; Micro Cracks; Lateral Series Resistance; Shunt Resistance; Semiconductor Impurity Levels; Open Circuits &/or Discontinuities in conductors; Polysilicon Grain Boundaries; PV Relative Efficiencies,/span> This toolset is scalable and configurable for production Line Pass/Fail Criteria, including cell/module sorting and grading. Quantification of EL signals against standard IV curves is included in the software to provide other data essential to manufacturing processes control. Left Coast Instruments will be exhibiting at the following trade shows in 2008: MARCH: Semicon China, Shanghai, China PRC APRIL: Materials Research Society (MRS), San Francisco,CA, USA MAY: IEEE Photovoltaic Specialists Conference, San Diego, CA, USA JUNE: South West Technical Workshop (IEEE-SWTW) San Diego, CA, USA JULY: International Symposium on the Physical and Failure Analysis of Integrated Circuits (IEEE-IPFA), Singapore SEPTEMBER - OCTOBER: European Symposium Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Maastricht, Netherlands OCTOBER: Semicon Europa, Stuttgart, Germany NOVEMBER: International Symposium for Testing and Failure Analysis (ISFTA),Portland, OR, USA DECEMBER: American Society for Cell Biology, San Francisco,CA, USAMoscone South Hall Booth 1323 (we are exhibiting with Hitachi High Technologies) |