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| RELTRON: Fast EL Mapper & Solar Cell Inspector (Patents Pending) | |
 | Reltrons Fast EL Mapper is a low-light mapping
system designed for the rapid imaging of the low intensity per unit area emissions generated in forward-biased solar cells.
The intensity of the emitted EL signal is a function of the electron-hole concentration, which is exponentially related to the applied forward bias
voltage (the well known IV curve of a diode). Electroluminescence of photovoltaic devices provides valuable spatially-resolved details about
efficiency-degrading mechanisms in the cell/panel that can result from:
The Fast EL Mapper can be configured for both the Macro and the Micro detection of spatially-resolved bandgap emissions found in CIGS, CIS, CdTe, Poly-Si, Si photovoltaics. A number of Technical Bulletins are now available discussing both Electroluminescence and Photoluminescence Measurements for
Photovoltaics.
For copies of these, as well as for information on this system, its range of options and
configurations, including contactless quantiative Photon Emission Image Analysis please
contact
Left Coast Instruments, Inc. |
For more information please visit:
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Download Reltron Solar Brochure |
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